---
title: "CNF-MIM capacitors pass 1,000 hours of reliability test"
canonical_url: "https://www.smoltek.com/cnf-mim-capacitors-pass-1000-hours-of-reliability-test/12845/"
date: 2025-11-05
author: "Fredrik Liljeberg"
featured_image: "https://www.smoltek.com/wp-content/uploads/2025/11/220608-smoltek-renrum-07.webp"
categories:
  - name: "News"
    url: "https://www.smoltek.com/category/news.md"
tags:
  - name: "atomic layer deposition"
    url: "https://www.smoltek.com/topic/atomic-layer-deposition.md"
  - name: "capacitors"
    url: "https://www.smoltek.com/topic/capacitors.md"
  - name: "cnf-mim"
    url: "https://www.smoltek.com/topic/cnf-mim.md"
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    url: "https://www.smoltek.com/topic/nanotechnology.md"
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    url: "https://www.smoltek.com/topic/news.md"
  - name: "semi news"
    url: "https://www.smoltek.com/topic/semi-news.md"
  - name: "Smoltek Semi"
    url: "https://www.smoltek.com/topic/smoltek-semi.md"
---

# CNF-MIM capacitors pass 1,000 hours of reliability test

The suc­cess­ful test proves the long-term reli­a­bil­i­ty and strength­ens the ongo­ing indus­tri­al­iza­tion work togeth­er with Yageo and oth­er poten­tial part­ners, which also brings the tech­nol­o­gy clos­er to com­mer­cial production.

> **“The results are extreme­ly promis­ing – they demon­strate that our CNF-MIM con­cept is not only high-per­for­mance, but also fun­da­men­tal­ly reli­able over time under real­is­tic oper­at­ing con­di­tions. We have already shared the out­come with Yageo, and thanks to this progress, the next dura­bil­i­ty test will be car­ried out direct­ly at their facil­i­ties.“**  
> *Farzan Gha­vani­ni, CTO of Smoltek*

**Test results in brief**  
The test was con­duct­ed on 20 CNF-MIM capac­i­tors that were con­tin­u­ous­ly oper­at­ed for 1,000 hours at 85°C while being biased at 2 V – stan­dard con­di­tions for capac­i­tor indus­try dura­bil­i­ty tests. After the test, none of the capac­i­tors showed any notice­able change in capac­i­tance. More impor­tant­ly, 19 out of 20 units main­tained an insu­la­tion resis­tance above the tar­get lev­el of 1 GΩ, which is con­sis­tent with well-estab­lished indus­try criteria.

The sin­gle ear­ly out­lier that did not meet the tar­get had already been iden­ti­fied as the com­po­nent with the high­est leak­age in the batch before the test start­ed. Such ear­ly out­liers (“infant fail­ures”) are nor­mal­ly sort­ed out in a burn-in step before reli­a­bil­i­ty test­ing. Smoltek is now imple­ment­ing this burn-in process, and with this step in place, the com­pa­ny expects all units in the future to pass cor­re­spond­ing test conditions.

* * *

Read the offi­cial press release here: [*Smoltek Semi reach­es key mile­stone that brings CNF-MIM capac­i­tors clos­er to com­mer­cial­iza­tion*](https://news.cision.com/smoltek-nanotech-holding-ab/r/smoltek-semi-reaches-key-milestone-that-brings-cnf-mim-capacitors-closer-to-commercialization,c4262457).