---
title: "CNF-MIM Capacitors Reliability Validated by Major Capacitor Manufacturer"
canonical_url: "https://www.smoltek.com/cnf-mim-capacitors-reliability-validated-by-major-capacitor-manufacturer-duplicate/23490/"
date: 2026-02-24
author: "Fredrik Liljeberg"
featured_image: "https://www.smoltek.com/wp-content/uploads/2023/02/220608-smoltek-renrum-10-jpg.webp"
categories:
  - name: "News"
    url: "https://www.smoltek.com/category/news.md"
tags:
  - name: "capacitors"
    url: "https://www.smoltek.com/topic/capacitors.md"
  - name: "cnf-mim"
    url: "https://www.smoltek.com/topic/cnf-mim.md"
  - name: "current leakage"
    url: "https://www.smoltek.com/topic/current-leakage.md"
  - name: "life test"
    url: "https://www.smoltek.com/topic/life-test.md"
  - name: "nanotechnology"
    url: "https://www.smoltek.com/topic/nanotechnology.md"
  - name: "news"
    url: "https://www.smoltek.com/topic/news.md"
  - name: "semi news"
    url: "https://www.smoltek.com/topic/semi-news.md"
  - name: "Smoltek Semi"
    url: "https://www.smoltek.com/topic/smoltek-semi.md"
---

# CNF-MIM Capacitors Reliability Validated by Major Capacitor Manufacturer

Ultra-low leak­age and sta­ble elec­tri­cal para­me­ters at ele­vat­ed tem­per­a­ture are crit­i­cal for next-gen­er­a­tion semi­con­duc­tor appli­ca­tions. Reduced leak­age cur­rent min­i­mizes stress, lim­its heat gen­er­a­tion, and improves long-term sta­bil­i­ty – key require­ments in AI data cen­ters and advanced com­put­ing sys­tems where pow­er den­si­ty and ther­mal man­age­ment are deci­sive factors.

On Feb­ru­ary 5 we report­ed that the CNF-MIM capac­i­tors showed [*sta­ble per­for­mance in a 1,000-hour reli­a­bil­i­ty test*](https://www.smoltek.com/cnf-mim-capacitors-demonstrate-1000x-lower-current-leakage-in-life-test/21983/). Now we can announce that an inde­pen­dent third-par­ty oper­a­tional life test has ver­i­fied sta­ble per­for­mance over 1,000 hours under applied volt­age — with zero fail­ures and no observed degra­da­tion in capac­i­tance, equiv­a­lent series resis­tance (ESR), or insu­la­tion resis­tance. Leak­age cur­rent remained in the picoam­pere range, with an insu­la­tion resis­tance of 1,000 GΩ at rat­ed voltage.

**Val­i­da­tion under strict con­di­tions**  
The exter­nal life test sub­ject­ed the CNF-MIM capac­i­tors to con­tin­u­ous oper­a­tion for 1,000 hours at 85°C with con­stant volt­age bias, sim­u­lat­ing pro­longed use in ther­mal­ly demand­ing semi­con­duc­tor envi­ron­ments such as AI accel­er­a­tors, advanced proces­sors, high-per­for­mance com­put­ing (HPC) sys­tems and RF appli­ca­tions. Test­ing at an ele­vat­ed tem­per­a­ture rep­re­sents an accel­er­a­tion of aging mech­a­nisms, pro­vid­ing con­fi­dence in long-term field reli­a­bil­i­ty and oper­a­tional stability.

* * *

Read the offi­cial press release: [*Smoltek’s CNF-MIM Capac­i­tors Reli­a­bil­i­ty Val­i­dat­ed by Major Capac­i­tor Manufacturer*](https://news.cision.com/smoltek-nanotech-holding-ab/r/smoltek-s-cnf-mim-capacitors-reliability-validated-by-major-capacitor-manufacturer,c4311507)