---
title: "Smoltek accelerates the device prototyping process"
canonical_url: "https://www.smoltek.com/smoltek-accelerates-the-device-prototyping-process/7938/"
date: 2024-10-11
author: "Fredrik Liljeberg"
featured_image: "https://www.smoltek.com/wp-content/uploads/2023/04/FG-intervju-2022-07-scaled.webp"
categories:
  - name: "News"
    url: "https://www.smoltek.com/category/news.md"
tags:
  - name: "capacitance density"
    url: "https://www.smoltek.com/topic/capacitance-density.md"
  - name: "capacitors"
    url: "https://www.smoltek.com/topic/capacitors.md"
  - name: "cnf-mim"
    url: "https://www.smoltek.com/topic/cnf-mim.md"
  - name: "nanotechnology"
    url: "https://www.smoltek.com/topic/nanotechnology.md"
  - name: "news"
    url: "https://www.smoltek.com/topic/news.md"
  - name: "semi news"
    url: "https://www.smoltek.com/topic/semi-news.md"
  - name: "Smoltek Semi"
    url: "https://www.smoltek.com/topic/smoltek-semi.md"
---

# Smoltek accelerates the device prototyping process

The new zap­ping method cuts the time to man­u­fac­ture test capac­i­tors from near­ly a month to just one week. The faster man­u­fac­tur­ing process enables Smoltek’s researchers to con­duct more exper­i­ments that accel­er­ate major tech­nol­o­gy advances – mak­ing the CNF-MIM tech­nol­o­gy more attrac­tive to poten­tial buyers.

> ***By cut­ting the devel­op­ment time so dra­mat­i­cal­ly, we can iter­ate faster and focus more on opti­miz­ing per­for­mance. This effi­cien­cy allows us to explore new con­fig­u­ra­tions and achieve break­throughs much soon­er, which strength­ens our posi­tion when engag­ing with poten­tial buy­ers.***
> 
> Farzan Gha­vani­ni, CTO at Smoltek.

The new method, called zap­ping, is exclu­sive­ly used dur­ing the devel­op­ment phase to expe­dite test­ing. It enables researchers to quick­ly eval­u­ate new con­fig­u­ra­tions and mate­ri­als using sim­pli­fied test capac­i­tors, sav­ing valu­able time and resources.

> Zap­ping is a clear advan­tage for us and our share­hold­ers. Faster devel­op­ment cycles mean short­er time to mar­ket for break­throughs, like tripling capac­i­tance den­si­ty and halv­ing leak­age current.
> 
> Farzan Gha­vani­ni

**Zap­ping, explained:**  
The zap­ping method involves briefly apply­ing a high volt­age across spe­cif­ic con­tact points on a test capac­i­tor, cre­at­ing a con­trolled break­down in the insu­lat­ing lay­er. This tech­nique elim­i­nates the need for mul­ti­ple com­plex etch­ing steps, sig­nif­i­cant­ly stream­lin­ing the test­ing process. 

For a more detailed expla­na­tion of the zap­ping method and its impact on Smoltek’s capac­i­tor tech­nol­o­gy devel­op­ment, [please vis­it the com­pa­ny’s IR blog](https://www.smoltek.com/category/ir-blog-posts/).