---
title: "Smoltek’s zirconia based dielectric stack passes preliminary 1,000-hour reliability test"
canonical_url: "https://www.smoltek.com/smolteks-zirconia-based-dielectric-stack-passes-preliminary-1000-hour-reliability-test/8029/"
date: 2024-12-18
author: "Fredrik Liljeberg"
featured_image: "https://www.smoltek.com/wp-content/uploads/2024/12/anders-l-wirebonded-stv-pp-caps.webp"
categories:
  - name: "News"
    url: "https://www.smoltek.com/category/news.md"
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  - name: "capacitance density"
    url: "https://www.smoltek.com/topic/capacitance-density.md"
  - name: "capacitors"
    url: "https://www.smoltek.com/topic/capacitors.md"
  - name: "cnf-mim"
    url: "https://www.smoltek.com/topic/cnf-mim.md"
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    url: "https://www.smoltek.com/topic/nanotechnology.md"
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    url: "https://www.smoltek.com/topic/news.md"
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    url: "https://www.smoltek.com/topic/semi-news.md"
  - name: "Smoltek Semi"
    url: "https://www.smoltek.com/topic/smoltek-semi.md"
---

# Smoltek’s zirconia based dielectric stack passes preliminary 1,000-hour reliability test

In Sep­tem­ber, Smoltek Semi start­ed test­ing its new­ly devel­oped zir­co­nia based dielec­tric stack for reli­a­bil­i­ty. The eval­u­a­tion has been car­ried out by Smoltek’s part­ner, Yageo, on spe­cial­ly designed test capac­i­tors incor­po­rat­ing the new stack**\***.

We have now received the results after the 1,000-hour mark, which show zero fail­ures and only very minor changes in key per­for­mance indi­ca­tors of the capac­i­tor, such as capac­i­tance val­ue and leak­age cur­rent. These results are very encour­ag­ing and increase our con­fi­dence that the CNF-MIM capac­i­tors fab­ri­cat­ed using the same dielec­tric stack will also pass the reli­a­bil­i­ty test.

> *DC life test is an impor­tant com­po­nent of the full reli­a­bil­i­ty test com­mon­ly imple­ment­ed on capac­i­tors.*
> 
> Anders Lund­gren, Project Man­ag­er at Smoltek Semi.

***\*** The capac­i­tors were sub­ject­ed to a DC life test tar­get­ing 1,000 hours dur­ing which they were biased at 2.0V DC and were exposed to 85°C.*

![Close-up of wire bonded test capacitors on the PCB](https://www.smoltek.com/wp-content/uploads/2024/12/wirebonded-stv-pp-caps-close-up-01.webp)

Close-up of wire bond­ed test capac­i­tors on the PCB.