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Research paper published in the proceedings of 2021 IEEE 71st Electronic Components and Technology Conference (ECTC), 2021, pp. 2229-2234.
E Passalacqua, C Laprais, M Bylund, Q Li, V Marknäs, R Andersson, A M Saleem, V Desmaris • August 10, 2021
In this paper, we proÂpose the introÂducÂtion of verÂtiÂcalÂly aligned carÂbon nanofibers (CNF) directÂly grown on the bondÂing pad by chemÂiÂcal vapor depoÂsiÂtion at CMOS comÂpatÂiÂble temÂperÂaÂtures as a soluÂtion to reinÂforce and conÂfine the solÂder joint between two chips bondÂed by solÂder. This conÂcept potenÂtialÂly enables the reducÂtion of pitchÂes and size of the solÂder interÂconÂnects. The solÂder joints are realÂized by therÂmal comÂpresÂsion bondÂing techÂnique and the assemÂblies are charÂacÂterÂized by means of elecÂtriÂcal meaÂsureÂments of daisy chains and kelvin strucÂtures formed by the conÂnecÂtion of the two chips. Flip chip interÂconÂnects based on two solÂder comÂposÂite soluÂtions (CNFs/​SnAg and CNFs/​SAC305) are anaÂlyzed in terms of elecÂtriÂcal resisÂtance, and difÂferÂent growth conÂdiÂtions for the CNFs and a post-growth treatÂment have been testÂed. The addiÂtion of the carÂbon nanofibers to the solÂder led to an addiÂtionÂal resisÂtance lowÂer than 10 % of the total resisÂtance, while posÂsiÂbly improvÂing the reliÂaÂbilÂiÂty of the joint.
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