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Research paper published in the proceedings of 2021 IEEE 71st Electronic Components and Technology Conference (ECTC), 2021, pp. 1205-1210.
S Krause, R Andersson, M Bylund, V Marknäs, E Passalacqua, S Kabir, V Desmaris • August 10, 2021
A physics-based modÂel is preÂsentÂed that capÂtures the elecÂtriÂcal high-freÂquenÂcy behavÂior of low-dimenÂsionÂal nanosÂtrucÂtures used in emergÂing techÂnoloÂgies such as the ultra-high-denÂsiÂty capacÂiÂtor. Derived from transÂmisÂsion line theÂoÂry the anaÂlytÂiÂcal expresÂsion proÂvides a freÂquenÂcy-depenÂdent admitÂtance of a lossy nanosÂtrucÂture, which can be numerÂiÂcalÂly inteÂgratÂed over arbiÂtrary areas comÂprisÂing the nanosÂtrucÂture. Edge effects, a disÂtribÂuted nature of resisÂtivÂiÂty or dimenÂsions of the nanosÂtrucÂture comÂprisÂing the device can be takÂen into conÂsidÂerÂaÂtion and make it a powÂerÂful tool for designÂing future inteÂgratÂed cirÂcuits. The modÂel preÂdicÂtions show an excelÂlent match with hardÂware meaÂsureÂments up to 3 GHz on state-of-the-art carÂbon nanofiber based MIM-capacÂiÂtors with capacÂiÂtance denÂsiÂties up to 500 nF/​mm2 at 6 μm device height.
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