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Research paper published in the IPC APEX EXPO Conference Proceedings, March 23–27, 2014.
V Desmaris, S Shafiee, S Kabir, A M Saleem, A Johansson, P Marcoux • April 16, 2014
While the denÂsiÂty of chip-to-chip and chip-to-packÂage comÂpoÂnent interÂconÂnecÂtions increasÂes and their size decreasÂes the ease of manÂuÂfacÂture and the interÂconÂnecÂtion reliÂaÂbilÂiÂty are being reduced. This paper will introÂduce the use of embedÂded fibers in the interÂconÂnecÂtions as a means of addressÂing these issues.
Flip chips bumps are evolvÂing from large solÂder balls down to small thin copÂper pilÂlars. Some copÂper pilÂlars are solÂder capped and use a therÂmo-comÂpresÂsion reflow attachÂment process. SmallÂer diamÂeÂter copÂper pilÂlars, while desirÂable by users, present a sigÂnifÂiÂcant chalÂlenge to assemÂblers and reliÂaÂbilÂiÂty issues for end-users.
NanosÂtrucÂtures in the form of carÂbon nanÂotubes have been evalÂuÂatÂed for years. The recentÂly creÂatÂed a means of growÂing metalÂlic carÂbon nanofibers, CNF’s, to micro bumps which are solÂderÂable. When embedÂded with solÂder the fiber bumps proÂduce robust comÂpoÂnent interÂconÂnecÂtions which can be less than 10 um in diamÂeÂter and up to 20 um high. AttachÂment of the fiber micro bumps uses conÂvenÂtionÂal therÂmo-comÂpresÂsion bonding.
Results from the most recent evalÂuÂaÂtions will be preÂsentÂed indiÂcatÂing elecÂtriÂcal perÂforÂmance and showÂing ease of manufacture
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