The new zap­ping method cuts the time to man­u­fac­ture test capac­i­tors from near­ly a month to just one week. The faster man­u­fac­tur­ing process enables Smoltek’s researchers to con­duct more exper­i­ments that accel­er­ate major tech­nol­o­gy advances – mak­ing the CNF-MIM tech­nol­o­gy more attrac­tive to poten­tial buyers.

By cut­ting the devel­op­ment time so dra­mat­i­cal­ly, we can iter­ate faster and focus more on opti­miz­ing per­for­mance. This effi­cien­cy allows us to explore new con­fig­u­ra­tions and achieve break­throughs much soon­er, which strength­ens our posi­tion when engag­ing with poten­tial buy­ers.

Farzan Gha­vani­ni, CTO at Smoltek.

The new method, called zap­ping, is exclu­sive­ly used dur­ing the devel­op­ment phase to expe­dite test­ing. It enables researchers to quick­ly eval­u­ate new con­fig­u­ra­tions and mate­ri­als using sim­pli­fied test capac­i­tors, sav­ing valu­able time and resources.

Zap­ping is a clear advan­tage for us and our share­hold­ers. Faster devel­op­ment cycles mean short­er time to mar­ket for break­throughs, like tripling capac­i­tance den­si­ty and halv­ing leak­age current.

Farzan Gha­vani­ni

Zap­ping, explained:
The zap­ping method involves briefly apply­ing a high volt­age across spe­cif­ic con­tact points on a test capac­i­tor, cre­at­ing a con­trolled break­down in the insu­lat­ing lay­er. This tech­nique elim­i­nates the need for mul­ti­ple com­plex etch­ing steps, sig­nif­i­cant­ly stream­lin­ing the test­ing process. 

For a more detailed expla­na­tion of the zap­ping method and its impact on Smoltek’s capac­i­tor tech­nol­o­gy devel­op­ment, please vis­it the com­pa­ny’s IR blog.