Ultra-low leak­age and sta­ble elec­tri­cal para­me­ters at ele­vat­ed tem­per­a­ture are crit­i­cal for next-gen­er­a­tion advanced semi­con­duc­tor appli­ca­tions, such as AI-chips, Radio Fre­quen­cy (RF) and optoelectronics. 

Why this is impor­tant
Reduced leak­age cur­rent min­i­mizes stress, lim­its heat gen­er­a­tion, and improves long-term sta­bil­i­ty – key require­ments in AI data cen­ters and advanced com­put­ing sys­tems where pow­er den­si­ty and ther­mal man­age­ment are deci­sive factors.

On Feb­ru­ary 23 we report­ed that the CNF-MIM capac­i­tors showed sta­ble per­for­mance in a 1,000-hour reli­a­bil­i­ty test, per­fomed by a major capac­i­tor man­u­fac­tur­er. Now we can announce that the inde­pen­dent third-par­ty oper­a­tional life test has been extend­ed to over 2,000 hours under applied voltage. 

The lat­est mea­sure­ments show that the capac­i­tors con­tin­ue to exhib­it sta­ble elec­tri­cal behav­ior under long-term bias at ele­vat­ed tem­per­a­ture, with no major changes observed. This fur­ther sup­ports the robust­ness of the CNF-MIM tech­nol­o­gy in semi­con­duc­tor appli­ca­tions where long-term sta­bil­i­ty, low leak­age and ther­mal reli­a­bil­i­ty are crucial.

Val­i­da­tion under very strict con­di­tions
The exter­nal life test sub­ject­ed the CNF-MIM capac­i­tors to con­tin­u­ous oper­a­tion for 1,000 hours at 85°C and 105°C with con­stant volt­age bias, sim­u­lat­ing pro­longed use in ther­mal­ly demand­ing semi­con­duc­tor envi­ron­ments such as AI accel­er­a­tors, advanced proces­sors, high-per­for­mance com­put­ing (HPC) sys­tems and RF appli­ca­tions. Test­ing at an ele­vat­ed tem­per­a­ture rep­re­sents an accel­er­a­tion of aging mech­a­nisms, pro­vid­ing con­fi­dence in long-term field reli­a­bil­i­ty and oper­a­tional stability.

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Read the offi­cial press release: Smoltek’s CNF-MIM tech­nol­o­gy con­tin­ues to demon­strate sta­ble per­for­mance in extend­ed life test con­duct­ed by glob­al capac­i­tor manufacturer