The new life test (a fol­low up on the pre­vi­ous life test in Novem­ber 2025) show strong results in the long-term sta­bil­i­ty of the CNF-MIM tech­nol­o­gy under real­is­tic oper­at­ing con­di­tions. In com­par­i­son, the new capac­i­tors demon­strate more than 1,000x low­er cur­rent leak­age while main­tain­ing sta­bil­i­ty through­out the 1,000-hour test. This cor­re­sponds to an impres­sive insu­la­tion resis­tance of 1,000 GΩ at the rat­ed voltage.

Ultra-low leak­age increas­es reli­a­bil­i­ty by reduc­ing con­tin­u­ous stress and heat gen­er­a­tion dur­ing oper­a­tion. In large-scale AI data cen­ters as well as HPC appli­ca­tions, this leads to more sta­ble long-term per­for­mance, few­er field fail­ures, and most impor­tant­ly, less heat gen­er­a­tion and pow­er con­sump­tion – fac­tors that our cus­tomers con­sid­er critical. 

“In Novem­ber 2025, we report­ed that our CNF-MIM capac­i­tors showed min­i­mal changes dur­ing a 1,000-hour reli­a­bil­i­ty test, with one capac­i­tor fail­ing ear­ly in the test. This new 1,000-hour oper­a­tional life test on a sub­se­quent batch marks a major step for­ward, demon­strat­ing excep­tion­al­ly sta­ble behav­ior with zero fail­ures – most notably with leak­age remain­ing in the picoam­pere range, while capac­i­tance and ESR remain unchanged.“
Farzan Gha­vani­ni, CTO of Smoltek

In par­al­lel with the inter­nal test, Smoltek has start­ed an exter­nal oper­a­tional life test of the CNF-MIM capac­i­tors, expect­ing the final out­come with­in the next two weeks (mid-Feb­ru­ary 2026). The exter­nal test results are expect­ed to strength­en the company’s ongo­ing dis­cus­sions with poten­tial indus­tri­al partners.

Test results in brief (capac­i­tors were char­ac­ter­ized before and after com­ple­tion of the life test) 

• Capac­i­tance den­si­ty: 170 nF/​mm² (no change after test) 
• Equiv­a­lent Series Resis­tance (ESR): 1500 mΩ (no change after test) 
• Insu­la­tion resis­tance: 1000 GΩ cor­re­spond­ing to 2 pA leak­age cur­rent at 2 V DC (no change after test)

---

Read the offi­cial press release: CNF-MIM Capac­i­tors Demon­strate 1,000x Low­er Cur­rent Leak­age in Life Test.