The EDAPS sym­po­sium con­sists of tech­ni­cal paper pre­sen­ta­tion, poster ses­sions, indus­try exhibits, work­shops and tuto­ri­als. Design­ers, engi­neers and researchers across the world come forth to share and dis­cuss their work on all aspects of elec­tri­cal sig­nal integri­ty includ­ing mod­el­ing, design and sim­u­la­tion, fab­ri­ca­tion, char­ac­ter­i­za­tion and packaging.

At the con­fer­ence, Vin­cent Des­maris, CTO of Smoltek, pre­sent­ed the Smoltek paper: “Ultra Thin Capac­i­tors based on Car­bon nanofibers with Ultra High Capac­i­tance Den­si­ty,” in which he said:

“We are tak­ing the oppor­tu­ni­ty to present the lat­est achieve­ments of our CNF-MIM tech­nol­o­gy, empha­siz­ing our lat­est tech­no­log­i­cal devel­op­ment. The CNF-MIM elec­tri­cal data now fea­ture an equiv­a­lent series resis­tance (ESR) of about 40 mΩ, which rep­re­sents more than a twofold improve­ment com­pared to data released at SEMICON Tai­wan 2019. This tech­no­log­i­cal step also put us on a par with the oth­er com­pet­ing tech­nolo­gies when it comes to elec­tri­cal data but at a frac­tion of their volume.”

At the clos­ing cer­e­mo­ny of the con­fer­ence Vincent’s pre­sen­ta­tion was award­ed ‘Best Oral Paper’-presentation. How­ev­er, by then the Smoltek team had already left the con­fer­ence for busi­ness meet­ings in Tai­wan. In fact, it wasn’t until yes­ter­day, when Vin­cent received an e‑mail from the EDAPS 2019 sec­re­tari­at inform­ing him on the award, that we became aware of the achievement.

Still, late news can be good news.

Image: Vin­cent Des­maris, CTO at Smoltek