The new zapping method cuts the time to manufacture test capacitors from nearly a month to just one week. The faster manufacturing process enables Smoltek’s researchers to conduct more experiments that accelerate major technology advances – making the CNF-MIM technology more attractive to potential buyers.

By cutting the development time so dramatically, we can iterate faster and focus more on optimizing performance. This efficiency allows us to explore new configurations and achieve breakthroughs much sooner, which strengthens our position when engaging with potential buyers.

Farzan Ghavanini, CTO at Smoltek.

The new method, called zapping, is exclusively used during the development phase to expedite testing. It enables researchers to quickly evaluate new configurations and materials using simplified test capacitors, saving valuable time and resources.

Zapping is a clear advantage for us and our shareholders. Faster development cycles mean shorter time to market for breakthroughs, like tripling capacitance density and halving leakage current.

Farzan Ghavanini

Zapping, explained:
The zapping method involves briefly applying a high voltage across specific contact points on a test capacitor, creating a controlled breakdown in the insulating layer. This technique eliminates the need for multiple complex etching steps, significantly streamlining the testing process.  

For a more detailed explanation of the zapping method and its impact on Smoltek’s capacitor technology development, please visit the company’s IR blog.