Smoltek has invest­ed in a new CVD-sys­tem for more effec­tive and ver­sa­tile growth of car­bon nanos­truc­tures. The com­ple­tion of the instal­la­tion and sub­se­quent com­mis­sion­ing of our new CVD-sys­tem to our research lab at Chalmers MC2-build­ing allows us to increase our CNF-MIM R&D capac­i­ty, mak­ing it pos­si­ble to pro­duce our CNF-MIM pro­to­type capac­i­tors on 150 mm wafers.

Fur­ther­more, the addi­tion of the new CVD-sys­tem pro­vides the nec­es­sary redun­dan­cy and process repro­ducibil­i­ty in order to meet the increas­ing num­ber of cus­tomer requests in terms of proof-of-con­cept and pro­to­types. This applies to semi­con­duc­tors as well as to the devel­op­ment of new tech­nol­o­gy appli­ca­tions in the field of ener­gy con­ver­sion and ener­gy stor­age (ie. elec­trolyz­ers and fuel cells).

R&D engi­neer Amin Saleem has made the first growth in this new sys­tem – a 150 mm wafer filled with CNF-MIM capacitors

New mea­sure­ment system

Smoltek has also invest­ed in a new mea­sur­ing instru­ment sys­tem, which pro­vides increased pos­si­bil­i­ties, not only for mea­sur­ing and elec­tri­cal­ly char­ac­ter­iz­ing of dif­fer­ent pro­to­types, but also assess the time and tem­per­a­ture sta­bil­i­ty and reli­a­bil­i­ty of our devices. The invest­ment will fur­ther increase the oppor­tu­ni­ties and cost effi­cien­cy of tech­nol­o­gy development.

R&D engi­neer Vic­tor Marknäs char­ac­ter­iz­ing CNF-MIM samples

“We will ben­e­fit great­ly from this expand­ed mea­sure­ment capac­i­ty where we can, for exam­ple, per­form reli­a­bil­i­ty tests and have a more ded­i­cat­ed mea­sure­ment set­up for CNF-MIM capac­i­tors. For all sam­ples we pro­duce, sev­er­al para­me­ters need to be char­ac­ter­ized, such as fre­quen­cies, leak­age cur­rent, volt­age depen­dence, tem­per­a­ture depen­dence and so on,” says Vic­tor Marknäs, R&D engi­neer at Smoltek.

Top image: R&D engi­neers at Chalmers MC2 laboratory