Smoltek has made investments in R&D equipment

Smol­tek has inves­ted in a new CVD-sys­tem for more effect­ive and ver­sat­ile growth of car­bon nano­struc­tures. The com­ple­tion of the install­a­tion and sub­sequent com­mis­sion­ing of our new CVD-sys­tem to our research lab at Chalmers MC2-build­ing allows us to increase our CNF-MIM R&D capa­city, mak­ing it pos­sible to pro­duce our CNF-MIM pro­to­type capa­cit­ors on 150 mm wafers.

Fur­ther­more, the addi­tion of the new CVD-sys­tem provides the neces­sary redund­ancy and pro­cess repro­du­cib­il­ity in order to meet the increas­ing num­ber of cus­tom­er requests in terms of proof-of-concept and pro­to­types. This applies to semi­con­duct­ors as well as to the devel­op­ment of new tech­no­logy applic­a­tions in the field of energy con­ver­sion and energy stor­age (ie. elec­tro­lyz­ers and fuel cells).

R&D engin­eer Amin Saleem has made the first growth in this new sys­tem – a 150 mm wafer filled with CNF-MIM capacitors

New meas­ure­ment system

Smol­tek has also inves­ted in a new meas­ur­ing instru­ment sys­tem, which provides increased pos­sib­il­it­ies, not only for meas­ur­ing and elec­tric­ally char­ac­ter­iz­ing of dif­fer­ent pro­to­types, but also assess the time and tem­per­at­ure sta­bil­ity and reli­ab­il­ity of our devices. The invest­ment will fur­ther increase the oppor­tun­it­ies and cost effi­ciency of tech­no­logy development.

R&D engin­eer Vic­tor Marknäs char­ac­ter­iz­ing CNF-MIM samples

“We will bene­fit greatly from this expan­ded meas­ure­ment capa­city where we can, for example, per­form reli­ab­il­ity tests and have a more ded­ic­ated meas­ure­ment setup for CNF-MIM capa­cit­ors. For all samples we pro­duce, sev­er­al para­met­ers need to be char­ac­ter­ized, such as fre­quen­cies, leak­age cur­rent, voltage depend­ence, tem­per­at­ure depend­ence and so on,” says Vic­tor Marknäs, R&D engin­eer at Smoltek.

Top image: R&D engin­eers at Chalmers MC2 laboratory