In Sep­tem­ber, Smoltek Semi start­ed test­ing its new­ly devel­oped zir­co­nia based dielec­tric stack for reli­a­bil­i­ty. The eval­u­a­tion has been car­ried out by Smoltek’s part­ner, Yageo, on spe­cial­ly designed test capac­i­tors incor­po­rat­ing the new stack*.

We have now received the results after the 1,000-hour mark, which show zero fail­ures and only very minor changes in key per­for­mance indi­ca­tors of the capac­i­tor, such as capac­i­tance val­ue and leak­age cur­rent. These results are very encour­ag­ing and increase our con­fi­dence that the CNF-MIM capac­i­tors fab­ri­cat­ed using the same dielec­tric stack will also pass the reli­a­bil­i­ty test.

DC life test is an impor­tant com­po­nent of the full reli­a­bil­i­ty test com­mon­ly imple­ment­ed on capac­i­tors.

Anders Lund­gren, Project Man­ag­er at Smoltek Semi.

* The capac­i­tors were sub­ject­ed to a DC life test tar­get­ing 1,000 hours dur­ing which they were biased at 2.0V DC and were exposed to 85°C.