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Smoltek’s zirconia based dielectric stack passes preliminary 1,000-hour reliability test
We are pleased to announce that the new zirconia based dielectric stack, previously reported to show 230% improvement in capacitance density, has now passed the 1,000-hour DC life test, a preliminary reliability test, carried out by capacitor manufacturer Yageo.
December 18, 2024
In September, Smoltek Semi started testing its newly developed zirconia based dielectric stack for reliability. The evaluation has been carried out by Smoltek’s partner, Yageo, on specially designed test capacitors incorporating the new stack*.
We have now received the results after the 1,000-hour mark, which show zero failures and only very minor changes in key performance indicators of the capacitor, such as capacitance value and leakage current. These results are very encouraging and increase our confidence that the CNF-MIM capacitors fabricated using the same dielectric stack will also pass the reliability test.
DC life test is an important component of the full reliability test commonly implemented on capacitors.
Anders Lundgren, Project Manager at Smoltek Semi.
* The capacitors were subjected to a DC life test targeting 1,000 hours during which they were biased at 2.0V DC and were exposed to 85°C.
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